Search found 4 matches
- Thu May 15, 2014 6:04 pm
- Forum: Design For Testing (DFT)
- Topic: What is a lock-up latch & why it used in DFT
- Replies: 4
- Views: 17466
Re: What is a lock-up latch & why it used in DFT
Thanks. Both are good articles.
- Thu May 15, 2014 6:00 pm
- Forum: Design For Testing (DFT)
- Topic: Difference between boundary scan/partial scan/full scan
- Replies: 1
- Views: 10943
Re: Difference between boundary scan/partial scan/full scan
Boundary scan is different methodology from scan design. But both are DFT methodology.
Full Scan : All the flops are scan flops and are stithed in scan chain
Partial Scan : Not all the flops are converted into scan flops nor stitched.
Full Scan : All the flops are scan flops and are stithed in scan chain
Partial Scan : Not all the flops are converted into scan flops nor stitched.
- Thu May 15, 2014 5:57 pm
- Forum: Design For Testing (DFT)
- Topic: Difference between Stuck-at Fault and Transition Fault
- Replies: 1
- Views: 10688
Re: Difference between Stuck-at Fault and Transition Fault
Basic difference is : Stuck at fault is for detection of Stuck-0 and stuck-1 fault if it is inside design and Transition fault is to detect that the logic level from 0-1 and 1-0 properly transit within specific time or not?
- Thu May 15, 2014 5:52 pm
- Forum: Design For Testing (DFT)
- Topic: Minimum number of scan chain in a design
- Replies: 2
- Views: 10453
Re: Minimum number of scan chain in a design
Minimum number of scan chain is totally depends on Design. e.g. If design can support 2 to 3 chains, thn it helps in test time reduction. If we have 1 scan chain, thn we have more test time which is not mostly preferable in current industry as design is too large and also high complexity. So all thi...